Abstract: Product reliability is a function of effective usage and applied stress (both operational and environmental) conditions. The so-called usage here can manifest in different formats depending on the underlying failure governing processes, such as total miles driven for vehicle tires, cumulative charge-and-discharge cycles for batteries, total number of on/off cycles for power switches, total number of reads and writes for hard disk drives, etc. The applied stress conditions include mechanical load, electrical load, environmental temperature and humidity, solar radiation, chemical exposure, road vibration, etc. In real life, both usage ad stress levels within a specified mission time, t, are not fixed, but random variables; i.e., they are statistically distributed. During engineering life test design, people often pick the high percentiles for population usage and stress level as the field reference for the sake of conservativeness and safety margin, such as 90th percentile, 95th percentile, or even 99th percentile. This often yields very ambitious and even unrealistic test sample size and/or test duration requirements because the majority (say 90% or higher) of users in the field are assumed to be operating under extreme usage and stress conditions. The question often comes up as to which usage and stress percentile is the appropriate choice so that the overall population reliability is assured. Is it mean, median, or some other percentile (such as 60%, 70%, etc.)?
In the meantime, it is a common phenomenon in real world that a product under a common input stressing environment, such as elevated ambient temperature, thermal cycling in a chamber, random vibration on a shake table, etc., may experience different stress response (such as junction temperature, physical displacement and acceleration, etc.) at different component locations. This can be caused by localized variation of stress-governing factors, such as power consumption, location, geometry, structure resonance, and material uniformity, etc. For life test design of such a product, people often pick the component (or location) with the highest stress as the reference point to calculate the desired sample size and test duration, and ignoring all other components. This will certainly yield a conservative test design with longer test time, and/or more sample size, due to underestimated acceleration factor. Oftentimes, it ends up with something unaffordable. The argument or question from engineering community often includes
- Product reliability target is for the whole system, not just for those high-stress components.
- ProductAre we over testing those components with less stress responses?
- Can we leverage the stress levels of the other components to come up with something more reasonable?
Based on the numerous research papers published by the speaker in the last few years, this talk will first introduce the so-called reliability-equivalence principle for the above scenarios. Then, the corresponding derived reliability-equivalent reference usage and stress models will be summarized. Numerical examples are given to illustrate the application of the derived results in product life test design and resource saving with respect to the traditional practice, especially for high-reliability and expensive product in modern industry.
Biography: Dr. Frank (Feng-Bin) Sun is currently a Technical Lead and Principal Reliability Engineer at Tesla Inc. with over 30 years of industry and academia experience. He has published two books and more than 50 papers in various areas of reliability, maintainability and quality engineering. Dr. Sun served in the editorial board as an Associate Editor for the IEEE Transactions on Reliability from 1999 to 2003 and from 2016 to 2023, Program Chair of ISSAT International Conference on Reliability and Quality in Design since 2014, and a committee member and session moderator of numerous international conferences on reliability. He received his Ph.D. in Reliability from University of Arizona and is a senior member of ASQ and the President of Society of Reliability Engineers Silicon (SRE) Valley Chapter. Dr. Sun received the RAMS 2013 A.O. Plait Best Tutorial Award, RAMS 2020 P.K. McElroy Best Paper Award, and RAMS 2024 Doug Ogden Best Paper Award by an SRE Member.