The course covers techniques of microstructural analysis (OM, SEM, TEM, electron diffraction, XRD), microchemical characterization (EDS, XPS, AES, SIMS, RBS, and Raman spectroscopy), various scanning probe microscopy techniques (AFM, STM, EFM, and MFM) as well as electrical (Hall, CV, Seebeck) and optical measurements (UV-Vis-NIR, Ellipsometry, PL, etc). It emphasizes on the information that can be obtained together with the advantages and limitations of each technique. The course has a laboratory component with written lab reports and a term paper.