MSE8016 - Materials Characterization Techniques | ||||||||
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| * The offering term is subject to change without prior notice | ||||||||
Course Aims | ||||||||
This course introduces the fundamental theoretical framework underlying the techniques and instrumentation used in characterizing structural, compositional, and surface properties of materials. The focus is on the acquisition of knowledge of characterization of materials properties and their corresponding physics, instrumentation consideration, strength, and limitations. Topics covered: Scanning Electron Microscopy (SEM), Energy Dispersive X-ray Spectroscopy (EDS), Transmission Electron Microscopy (TEM), Scanning Probe Microscopy (SPM), Scanning Tunnelling Microscopy (STM), Atomic Force Microscopy (AFM), Electron Energy Loss Spectroscopy, X-Ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES), Neutron Diffraction, X-ray Diffraction, Electron Diffraction, etc. | ||||||||
Assessment (Indicative only, please check the detailed course information) | ||||||||
Continuous Assessment: 50% | ||||||||
Examination: 50% | ||||||||
Examination Duration: 2 hours | ||||||||
Detailed Course Information | ||||||||
| MSE8016.pdf | ||||||||
Useful Links | ||||||||
| Department of Materials Science and Engineering | ||||||||
