MSE8015 - Theory and Practice of Transmission Electron Microscopy and Related Spectroscopy | ||||||||
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| * The offering term is subject to change without prior notice | ||||||||
Course Aims | ||||||||
The basic mathematics tools, Fourier transform and Convolution to illustrate the imaging theory of transmission electron microscopy (TEM) will be first introduced. The Abbe microscopy theory and lens aberration in Fourier optics will be discussed. The physics of electron Beam-Sample Interaction that gives the structural signal and radiation damage will be explained. Several imaging modes at atomic resolution such as high-resolution TEM (HRTEM) and scanning TEM (STEM) in parallel and focus beam modes, respectively, will be discussed in detail. The electron beam effect on the dose (rate) dependent in-situ TEM experiment will be explored in detail. Following the above topics, the theory and practice of the future trend of high space/time resolution TEM for atomic resolution dynamics will be discussed in depth. In the end, the theory of energy-dispersive X-ray spectroscopy (EDX), electron energy-loss spectroscopy (EELS), and electron magnetic circular dichroism (EMCD) will be lectured. | ||||||||
Assessment (Indicative only, please check the detailed course information) | ||||||||
Continuous Assessment: 50% | ||||||||
Examination: 50% | ||||||||
Examination Duration: 2 hours | ||||||||
Detailed Course Information | ||||||||
| MSE8015.pdf | ||||||||
Useful Links | ||||||||
| Department of Materials Science and Engineering | ||||||||
