MSE4179 - Advanced Materials Characterization and its Industrial Applications | ||||||||||
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* The offering term is subject to change without prior notice | ||||||||||
Course Aims | ||||||||||
The course "Advanced Materials Characterization Techniques" aims at the physical principles and quantitative analysis of imaging, diffraction and spectroscopy of photon (synchrotron X-Ray), electron and neutron, and their applications in a wide range of industrial sections, e.g. semiconductor, energy materials, chemical engineering, construction, information technology (IT) and aerospace. In terms of the spatial resolution, energy resolution, time resolution, detection sensitivity and efficiency, the various characterization techniques in the advanced instrumentation facilities such as synchrotron radiation X-ray source, spallation neutron source and aberration-corrected electron microscopes are compared to show their advantages and disadvantages on accessing the information, e.g. crystallographic structure, atomic position, electronic structure, spin texture, elemental distribution, magnetic properties, chemical bonding and dynamical evolution. This knowledge guides the students to choose the suitable characterization techniques to investigate the targeted structure of materials and understand its structure-property relationship in the industrial applications. | ||||||||||
Assessment (Indicative only, please check the detailed course information) | ||||||||||
Continuous Assessment: 50% | ||||||||||
Examination: 50% | ||||||||||
Examination Duration: 2 hours | ||||||||||
Detailed Course Information | ||||||||||
MSE4179.pdf |