MSE5301 - Instrumentation for Materials Characterization | ||||||||||||
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| * The offering term is subject to change without prior notice | ||||||||||||
Course Aims | ||||||||||||
This course introduces a fundamental theoretical framework for instrumentation techniques used in characterizing structural, compositional, and surface properties in materials. It aims to provide knowledge on characterization in terms of materials properties and corresponding physics, instrumentation consideration, strength, and limitations. It helps the students to choose suitable characterization techniques and instruments in terms of the desired structural, compositional, morphological, and chemical information of materials. Hands-on experience in a laboratory will be provided for several selected analytical techniques. Topics covered: generation principles and comparison of X-ray, electron, and neutron, diffraction
of X-ray, electron, and neutron; crystal structure representation; Fourier analysis; reciprocal
space; scanning probe microscopy including atomic force microscopy and scanning tunneling
microscopy; X-ray photoemission spectroscopy and X-ray energy-dispersive spectroscopy; and
scanning electron microscopy. | ||||||||||||
Assessment (Indicative only, please check the detailed course information) | ||||||||||||
Continuous Assessment: 50% | ||||||||||||
Examination: 50% | ||||||||||||
Examination Duration: 2 hours | ||||||||||||
Detailed Course Information | ||||||||||||
| MSE5301.pdf | ||||||||||||
Useful Links | ||||||||||||
| Department of Materials Science and Engineering | ||||||||||||
