The basically mathematics tools, Fourier transform and Convolution to illustrate the imaging theory of electron microscopy will be firstly introduced. The Abbe microscopy theory and lens aberration in Fourier optics will be discussed. The physics of electron Beam-Sample Interaction that gives the structural signal and radiation damage will be explained. Several imaging modes at atomic resolution in parallel (HRTEM) and focus beam modes will be discussed in detail. The electron beam effect on the dose (rate) dependent in-situ TEM experiment will be explored in detail. Finally, the theory and practice of the future trend of high space / time resolution TEM for atomic resolution dynamics will be discussed in depth. In the end, the theory of atomic resolution EDX and EELS will be lectured.

Continuous Assessment: 50%

Examination: 50%

Examination Duration: 2 hours