Dr. Juan Antonio Zapien
BSc (UNAM), PhD (PSU)
Assistant Professor
Research Interests
- Optical properties of nanostructures
- Optical characterization of nucleation & growth of thin films
- Optical & quantum confinement in nanomaterials
Publications
- J.A. Zapien, Y.K. Liu, Y.Y. Shan, H. Tang, C.S. Lee, and S.T. Lee, “Continuous near-infrared-to-ultraviolet lasing from II-VI nanoribbons” Appl. Phys. Lett. 90 (2007) 213114.
- T.Y. Lui, J.A. Zapien, H. Tang, D.D.D. Ma, Y.K. Liu, C.S. Lee, S.T. Lee, S.L. Shi, and S.J. Xu, “Photoluminescence and photoconductivity properties of copper-doped Cd1-XZnXS nanoribbons” Nanotechnology 17 (2006) 5935–5940.
- Y. Jiang, W.J. Zhang, J.S. Jie, X.M. Meng, J.A. Zapien, and S.T. Lee, “Homoepitaxial Growth and Lasing Properties of ZnS Nanowire and Nanoribbon Arrays” Adv. Mater. 18 (2006) 1527-1532.
- Y.Q. Li, J. A. Zapien, Y.Y. Shan, Y.K. Liu, and S.T. Lee “Manganese doping and optical properties of ZnS nanoribbons by postannealing”Appl. Phys. Lett. 88 (2006) 013115-013117.
- J.A. Zapien, A.S. Ferlauto, R.W. Collins “Application of Spectral and Temporal Weighted Error Functions for Data Analysis in Real-Time Spectroscopic Ellipsometry” Thin Solid Films 455 (2004) 106-111.
- J.A. Zapien, Y. Jiang, X.M. Meng, W. Chen, F.C.K. Au, Y. Lifshitz, and S.T. Lee “Room-Temperature Single Nanoribbon Lasers” Appl. Phys. Lett. 84 (2004) 1189-1191.
- S. Piscanec, M. Cantoro, A.C. Ferrari, J. A. Zapien, Y. Lifshitz, S.T. Lee, S. Hofmann, J. Robertson, “Raman spectroscopy of silicon nanowires” Phys. Rev. B 68 (24) 241312 (2003).
- J.A. Zapien, and R.W. Collins, “Determination of the optical functions of carbon-based materials using transmittance, reflectance and spectroscopic ellipsometry - a critical review”, New Diamond and Frontier Carbon Technologies 14 (2004) 129-145, invited review article.
- C.H. Liu, J.A. Zapien, Y. Yao, X. M. Meng, C.S. Lee, S.S. Fan, Y. Lifshitz, and S.T. Lee, “High-density, ordered ultraviolet light-emitting ZnO nanowire arrays” Adv. Mat. 15 (2003) 838.
- J.A. Zapien, R.W. Collins and R. Messier, “Multichannel Ellipsometer for Real Time Spectroscopy of Thin Film Deposition from 1.5 to 6.5 eV”, Rev. Sci. Instrum. 71, (2000) 3451-3460.