This course focuses on theories and applications of modern electron microscopy including Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and X-Ray Energy Dispersive Spectroscopy. Lectures cover basic electron optics, electron-beam and specimen interactions, electron diffraction, advanced electron imaging techniques and image interpretation, vacuum system and instrumentations, qualitative and quantitative X-ray microanalysis. The theoretical understanding gained by students will help them understand and interpret experimental data as well as perform electron microscopy experiments. Hands-on experience is also emphasized, which includes sample preparation techniques and use electron microscope(s).

Continuous Assessment: 40%

Examination: 60%

Examination Duration: 2 hours